Expertise
Prise en charge, Coordination, Réalisation d'expertises techniques et de
tests de conformité de produits sans contact (ISO/IEC 14443, NFC, ICAO,...).
Assistance technique et développement de produits.
ISO/IEC 7810 : Identification cards — Physical characteristics
- Dimensions of card
- Card construction
- Card materials
- Bending stiffness
- Flammability
- Toxicity
- Resistance to chemicals
- Card dimensional stability and warpage with temperature and humidity
- Light
- Durability
- Peel strength
- Adhesion or blocking
- Opacity, ID-1 size card
- Overall card warpage
- Resistance to heat
- Surface distortions
- Contamination and interaction of card components
- Resistance to heat test method
ISO/IEC 7816 : Identification cards -- Integrated circuit(s) cards with contacts
- Ultra-violet light
- X-rays
- Surface profile of contacts
- Mechanical strength (cards and contacts)
- Electrical resistance (contacts)
- Electromagnetic interference (magnetic stripe and integrated circuit)
- Static electricity
- Operating temperature
- Bending properties
- Torsion properties
- Dimensions of the contacts
- Number and location of the contacts
- Location of contacts relative to other technologies
ISO/IEC 10373 : Identification cards — Test methods
- Card warpage
- Dimensions of cards
- Peel strength
- Resistance to chemicals
- Card dimensional stability and warpage with temperature and humidity
- Adhesion or blocking)
- Bending stiffness
- Dynamic bending stress
- Dynamic torsional stress
- Opacity
- Ultraviolet light
- X-rays
- Static magnetic fields
- Embossing relief height of characters
- Resistance to heat
- Surface distortions and raised areas
- Magnetic stripe area warpage
- Height and surface profile of the magnetic stripe
- Surface roughness of the magnetic stripe
- Wear test for magnetic stripe
- Amplitude measurements
- Flux transition spacing variation
- Magnetic stripe adhesion
- Static magnetic characteristics
- Waveform Ui6
- Test methods for physical characteristics of ICCs with contacts
- Dimension and Location of Contacts
- Static electricity
- Electrical surface resistance of contacts
- Surface profile of contacts
- Test methods for electrical characteristics of ICCs with contacts
- VCC contact
- I/O contact
- CLK contact
- RST contact
- VPP contact
- Test methods for logical operations of ICCs with contacts
- Answer to Reset (ATR)
- T=0 Protocol
- T=1 Protocol
- Test methods for physical and electrical characteristics of the IFD
- Activation of contacts
- VCC contact
- I/O contact
- CLK contact
- RST contact
- VPP contact
- Test methods for logical operations of the IFD
- Answer to Reset (ATR)
- T=0 Protocol
- T=1 Protocol
- Additional Test Methods
- ICC — Mechanical strength: 3 wheel test
- IFD — Reaction of the IFD to invalid PCBs
- Static electricity test
- Test apparatus and test circuits
- Functional test - PICC
- Functional test - PCD
- PCD field strength
- Power transfer PCD to PICC
- Modulation index and waveform
- Load modulation reception (informative only)
- Additional test methods for PCD RF interface and PICC alternating field exposure
- Alternating magnetic field test
- Alternating electric field test
- Static electricity test
- Static magnetic field test
- "Class 1" PICC maximum loading effect
- Field strength of PCDs supporting operation with "Class 1" PICCs
- Static electricity test
- Test apparatus and test circuits
- Functional test - VICC
- Functional test - PCD
- VCD field strength and Power transfer
- Modulation index and waveform
- Load modulation reception (informative only)
ISO/IEC 18013 : Information technology — Personal identification — ISO-compliant driving licence — Part 1: Physical characteristics and basic data set
- Human-readable data elements on IDL
- Card Design
- Coding System and Pictograph Descriptions
- Document Security Elements
- Procedures for securing the issuance and use of IDLs
- Card durability
- Distinguishing Signs of Countries
- IDL Booklet
- Machine-readable functionality of IDLs
- General principles
- Mandatory functions
- Optional functions
- Machine-readable technologies supported
- Organization of data
- Data structure
- Application identifiers
- Functional requirements
- Access control
- Document authentication
- Data integrity validation
- Mapping of mechanisms to requirements and technologies
- Mechanisms
- Security mechanism indicator
- SIC LDS
- PKI
- Basic access protection
- Extended access protection
- SIC command set
- List of tags used
- Brainpool curves
ISO/IEC 15480 : Identification card systems - European Citizen Card - Part 1: Physical, electrical and transport protocol characteristics
- Methodology for the design of ECC durability testing
- Mission profile
- Durability class
- Durability profile
- Associating the mission profile to a durability profile
- Specifying the durability test plan
- Durability test core sequence (chemical exposure, temperature and humidity cycling, combined bending and torsions, abrasion tests, as the wear and soil, plasticizer exposure, xenon Arc UV)
- Initial physical and functional testing (dimensions, layer adhesion, electrical functions, ECC mandatory physical characteristics, module adhesion)
- Test sequencing
- Stand alone test
- 3-Wheel test
- Wear and soil test
- UV light ageing test
ISO/IEC 24789 : Identification cards — Card service life — Part 1: Application profiles and requirements
- Card applications and their profiles
- Determination of the application profile
- Determination of the aging and usage classes
- Determination of the evaluation regim
- Evaluation regime using stand alone methods
- Evaluation regime using evaluation sequences
- Methods of evaluation for card service life (CSL)
- Xenon arc light exposure
- Surface abrasion
- Magnetic stripe abrasion
- ICM adhesion
- Plasticised vinyl storage
- Wear and soil test
- Temperature and humidity aging
- Temperature shock
- Temperature and humidity cycling
- ID-1 card flexure
- Temperature and humidity aging followed by peel strength testing
- Cross-cut test
- Shortened bendings method
ISO/IEC 15693-1 : Identification cards — Contactless integrated circuit(s) cards — Vicinity Integrated Circuit(s) Card Part 1: Physical characteristics
ISO 105-E04 : Textiles — Tests for colour fastness — Part E04: Colour fastness to perspiration
ISO/IEC 60068 : Environmental testing
- Part 2-1: Tests - Cold
- Part 2-2: Tests - Dry heat
- Part 2-44: Tests - Soldering
- Part 2-45: Tests - Immersion in cleaning solvents
- Part 2-52: Tests - Salt mist
- Part 2-78: Tests - Test cab: Damp heat, steady state
ISO 14443 tests
Compliance tests with the main ISO standards (10373-6, 14443-2-3-4 type A & B)
- Operating volume
- Power transfer capability in load
- Modulation index without load measurement
- Modulation waveform measurement
- Retro-modulation sensibility characterisation
- Measurement of Request Guard Time Type A
- Frame Delay Time (FDT) Type A measurement
- Extra Guard Time (EGT) Type B measurement
- Timing between PICC EO Frame and PCD Type B, Start of Frame (SOF) measurement
- Load modulation measurement
- Reception capability characterisation
- Frame Delay Time (FDT) Type A Measurement
- Frame Delay Time (FDT) Type B Measurement
- Load modulation measurement
- Reception capability characterisation
- Resonance frequency
- Alternating magnetic field
- Load Magnetic field
- General Physical characteristics
- Dimensions
- Ultra-violet light
- X-rays
- Dynamic bending stress
- Dynamic torsional stress
- Alternating magnetic fields
- Alternating electric field
- Static electricity
- Static magnetic field
- Operating temperature
- Standards compatibility
- Surface quality for printing
- Initial dialogue for proximity cards (Power transfer, Frequency, Operating field)
- Signal interface
- Communication signal interface Type A (Communication PCD to PICC, Bit rate, Modulation, Bit representation and coding)
- Communication signal interface Type A (Communication PICC to PCD, Bit rate, Load Modulation, Subcarrier, Subcarrier modulation, Bit representation and coding)
- Communication signal interface Type B : Communication PCD to PICC
- Communication signal interface Type B : Communication PICC to PCD
- PICC minimal coupling zone
- Polling
- Type A – Initialization and anticollision
- Frame format and timing
- PICC states
- Command set
- Select sequence
- Type B – Initialization and anticollision
- Character, frame format and timing
- CRC_B
- Anticollision sequence
- PICC states description
- Command set
- Anticollision response rules
- REQB/WUPB Command
- Slot-MARKER Command
- ATQB Response
- ATTRIB Command
- Answer to ATTRIB Command
- HLTB Command and Answer
- Protocol activation of PICC Type A
- Request for answer to select
- Answer to select
- Protocol and parameter selection request
- Protocol and parameter selection response
- Activation frame waiting time
- Error detection and recovery
- Protocol activation of PICC Type B
- Half-duplex block transmission protocol
- Block format
- Frame waiting time
- Frame waiting time extension
- Power level indication
- Protocol operation
- Multi-Activation
- Protocol deactivation of PICC Type A and Type B
- Deactivation frame waiting time
- Error detection and recovery
- Protocol scenarios